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Patent # Description
US-7,253,474 Quasi-vertical semiconductor component
A quasi-vertical semiconductor component in which, by variation of the layout, the process or the wiring of inner cells, a compensation for a voltage drop along...
US-7,253,471 Semiconductor structure having thick stabilization layer
A semiconductor structure has a semiconductor substrate (3, 4), on/in whose top side a structure comprising semiconductor layers, metal layers and insulator...
US-7,253,456 Diode structure and integral power switching arrangement
A diode structure having high ESD stability is described. Other embodiments provide an integral power switching arrangement having an integrated low leakage diode.
US-7,253,050 Transistor device and method of manufacture thereof
Methods of forming CMOS devices and structures thereof. A workpiece is provided having a first region and a second region. A high k gate dielectric material is...
US-7,253,016 Micromechanical capacitive transducer and method for producing the same
A micromechanical capacitive converter and a method for manufacturing a micromechanical converter comprise a movable membrane and an electrically conductive face...
US-7,253,009 Method of producing an integrated circuit arrangement with field-shaping electrical conductor
An integrated circuit arrangement includes at least one electrical conductor that, when a current flows through it, produces a magnetic field that acts on at...
US-7,252,913 Method for projection of a circuit pattern, which is arranged on a mask, onto a semiconductor wafer
A simulation is carried out of a projection based on an electronically stored circuit pattern and adjustable projection parameters and optical parameters which...
US-7,251,772 Circuit arrangement having a number of integrated circuit components on a carrier substrate and method for...
A circuit arrangement can have a number of integrated circuit components, which are arranged on a carrier substrate. A reception circuit for receiving a control...
US-7,251,758 Semiconductor device testing apparatus, system, and method for testing the contacting with semiconductor...
A semiconductor device testing apparatus, system, and method, in particular for testing the contacting with semiconductor devices positioned one upon the other,...
US-7,251,497 Signal-to-interference ratio estimation for CDMA
Calculating of signal-to-interference ratio (SIR) of a mobile device in a wireless communication system. A communication signal transmitted by the mobile device...
US-7,251,284 QAM receiver
A QAM receiver is disclosed. According to one aspect, a QAM receiver includes a signal input for receiving an analog input signal. Further, the QAM receiver...
US-7,251,269 Apparatus and method for fine synchronization when sampling spread-coded received signals
In order to determine the optimal sampling point for a series of spread-coded data, received by a radio, a correlation data series is used that is produced by...
US-7,251,178 Current sense amplifier
A high-speed current sense amplifier has complementary reference cells and load devices that eliminate capacitive mismatch contributions. The current sense...
US-7,251,152 Memory circuit having memory cells which have a resistance memory element
In a memory circuit having memory cells which are connected in series between a ground line PL and a bit line BL and in each case have a resistance memory...
US-7,251,016 Method for correcting structure-size-dependent positioning errors in photolithography
A method for correcting structure-size-dependent positioning errors during the photolithographic projection by an exposure apparatus and the use thereof includes...
US-7,250,896 Method for pipelining analog-to-digital conversion and a pipelining analog-to-digital converter with successive...
A method for pipelining an analog-to-digital conversion of an analog input signal into an N-bit digital output signal is disclosed where a multiplexer is used...
US-7,250,801 Differential duty cycle restoration
Embodiments of the invention provide methods and apparatuses for restoring a duty cycle of a complementary output signal pair. In one embodiment, the output...
US-7,250,662 Magnetically lined conductors
A conductor with improved magnetic field per current ratio is disclosed. The conductor includes a magnetic liner lining a second surface and sides thereof. The...
US-7,250,659 Semiconductor component with ESD protection
The semiconductor component has ESD protective elements configured outside the semiconductor body. The ESD protective elements connect an additional conductor...
US-7,250,651 Semiconductor memory device comprising memory cells with floating gate electrode and method of production
Transistor bodies of semiconductor material located at a main surface of a semiconductor substrate between shallow trench isolations are provided with a rounded...
US-7,250,650 Field-effect transistor structure and associated semiconductor memory cell
A field-effect transistor (FET) structure and method of formation thereof is presented. The FET structure includes first and second source/drain regions formed...
US-7,250,620 EUV lithography filter
Filters for EUV lithography, methods of manufacture thereof, and methods of filtering in an EUV lithography system are disclosed. The filter comprises a nanotube...
US-7,250,590 Optoelectronic arrangement and a method for controlling the output power of a transmission component
The invention relates to an optoelectronic arrangement which has a transmission component which emits electromagnetic radiation, a receiving component which...
US-7,250,343 Power transistor arrangement and method for fabricating it
In the case of the cost-effective method according to the invention for fabricating a power transistor arrangement, a trench power transistor arrangement (1) is...
US-7,250,336 Method for fabricating a shadow mask in a trench of a microelectronic or micromechanical structure
The present invention provides a method for fabricating a shadow mask in a trench of a microelectronic or micromechanical structure, comprising the steps of:...
US-7,249,301 Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuit
A semiconductor circuit can have a standard interface for external data, address and/or command interchange in normal operation and a further test interface...
US-7,248,700 Device and method for calculating a result of a modular exponentiation
In a device for calculating a result of a modular exponentiation, the Chinese Residue Theorem (CRT) is used, wherein two auxiliary exponentiations are calculated...
US-7,248,692 Method of and apparatus for determining a key pair and for generating RSA keys
In a method of determining a pair of numbers comprising a first number and a second number, in which the first number may be a first key and the second number...
US-7,248,536 Integrated semiconductor memory and method for operating an integrated semiconductor memory
A semiconductor memory and a method for operating the latter in order are provided, at least in testwise fashion, to deactivate a word line segment (12) of a...
US-7,248,530 Integrated semiconductor memory device
An integrated semiconductor memory device includes external terminals to which an input signal can be applied to each external terminal, and a register circuit...
US-7,248,511 Random access memory including selective activation of select line
A random access memory that includes an array of memory cells, a first circuit configured to receive an address to address memory cells in the array of memory...
US-7,248,506 Circuit arrangement having security and power saving modes
Circuit arrangement having complementary data input nodes for reception of a dual rail data signal and complementary data output nodes for outputting a dual rail...
US-7,248,365 Method for adjusting a substrate in an appliance for carrying out exposure
The unevennesses of a chuck are measured at various positions and are stored, as discrepancies from an idealized plane, in a databank. The measured discrepancies...
US-7,248,351 Optimizing light path uniformity in inspection systems
An inspection system includes an illumination source configured to illuminate a blazed phase grating sample, image collection pathways and an imaging system...
US-7,248,218 Reliability and the accuracy of position-finding methods by estimation of the Rice factor of a radio link
In order to improve the reliability and the accuracy of a position-finding method such as the GPS method, the quality of a radio link which is used for the...
US-7,248,106 Sampling signal amplifier
A sampling differential amplifier for amplification of a signal having: a signal input (2) for application of an input signal to be amplified; signal...
US-7,248,102 Internal reference voltage generation for integrated circuit testing
For one or more disclosed methods, a supply voltage is supplied to an integrated circuit, the integrated circuit is placed in a test mode to select one of a...
US-7,248,067 Semiconductor device with test circuit disconnected from power supply connection
A semiconductor device with a test circuit disconnected from a power supply connection to reduce leakage current, and a method of manufacture thereof. The test...
US-7,247,956 Performance test board
Performance Test Board for connecting at least one device under test (DUT) to a test system which has internal power supply sources (IPS) wherein said...
US-7,247,948 Semiconductor device and method for fabricating the semiconductor device
A semiconductor device has a semiconductor substrate, at least a first and second rewiring device on a first surface of the semiconductor substrate for the...
US-7,247,926 High-frequency switching transistor
A high-frequency switching transistor comprises a collector area, which has a first conductivity type, a first barrier area bordering on the collector area,...
US-7,247,735 Octupolar molecules used as organic semiconductors
In the case of the materials according to the invention, the charge carrier mobility in the correspondingly prepared films is achieved if the molecules are...
US-7,246,951 Method and apparatus for optically coupling an optical waveguide to an optical module
A method for optical coupling an optical waveguide to an optical unit arranged in or on an optical module, a corresponding optical module, coupling element, and...
US-7,246,291 Method for localization and generation of short critical sequence
A method for localization and generation of short critical sequence uses an automatic test equipment to test an electronic device (e.g., memory device) by...
US-7,246,278 Apparatus for testing a memory module
An apparatus (1) for testing a memory module (2) suitable for exchanging electrical signals with a motherboard (10) contains a device (8a 8k) suitable for...
US-7,245,667 Method of transmitting data
In a data transmission method, the data to be transmitted and/or data corresponding to the same are transmitted via a first transmission channel and in addition...
US-7,245,554 Integrated semiconductor memory with clock-synchronous access control
An integrated semiconductor memory device includes a first input amplifier which, compared with a second input amplifier, has a lower sensitivity with regard to...
US-7,245,552 Parallel data path architecture
A memory device includes: a memory array for storing data; data pads for supplying as an output of the memory device data retrieved from the memory array in a...
US-7,245,544 Integrated semiconductor memory device including sense amplifiers
An integrated semiconductor memory device includes a memory cell array with sense amplifiers that are combined in groups within the memory cell array. Each sense...
US-7,245,351 Alignment mark for coarse alignment and fine alignment of a semiconductor wafer in an exposure tool
An alignment mark for the coarse alignment and fine alignment of a semiconductor wafer in an exposure tool includes a first partial structure for generating a...
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